发明授权
US07719752B2 MEMS structures, methods of fabricating MEMS components on separate substrates and assembly of same
有权
MEMS结构,在单独基板上制造MEMS部件的方法及其组装
- 专利标题: MEMS structures, methods of fabricating MEMS components on separate substrates and assembly of same
- 专利标题(中): MEMS结构,在单独基板上制造MEMS部件的方法及其组装
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申请号: US11863079申请日: 2007-09-27
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公开(公告)号: US07719752B2公开(公告)日: 2010-05-18
- 发明人: Jeffrey Brian Sampsell , Brian James Gally , Philip Don Floyd
- 申请人: Jeffrey Brian Sampsell , Brian James Gally , Philip Don Floyd
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM MEMS Technologies, Inc.
- 当前专利权人: QUALCOMM MEMS Technologies, Inc.
- 当前专利权人地址: US CA San Diego
- 代理机构: Knobbe, Martens, Olson & Bear LLP
- 主分类号: G02B26/00
- IPC分类号: G02B26/00 ; H01L21/00
摘要:
Methods of fabricating a microelectromechanical systems (MEMS) device with reduced masking and MEMS devices formed by the same are disclosed. In one embodiment, a MEMS device is fabricated by laminating a front substrate and a carrier, each of which has components preformed thereon. The front substrate is provided with stationary electrodes formed thereover. A carrier including movable electrodes formed thereover is attached to the front substrate. The carrier of some embodiments is released after transferring the movable electrodes to the front substrate. In other embodiments, the carrier stays over the front substrate, and serves as a backplate for the MEMS device. Features are formed by deposition and patterning, by embossing, or by patterning and etching. In some embodiments in which the MEMS device serves as an interferometric modulator, the front substrate is also provided with black masks to prevent or mitigate bright areas in the actuated state of the MEMS device. Static interferometric modulators can also be formed by shaping or preformation and lamination. The methods not only reduce the manufacturing costs, but also provide a higher yield. The resulting MEMS devices can trap smaller volumes between laminated substrates and are less susceptible to pressure variations and moisture leakage.
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