发明授权
- 专利标题: X-ray fluorescence analysis to determine levels of hazardous substances
- 专利标题(中): X射线荧光分析确定有害物质的含量
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申请号: US12064624申请日: 2006-08-14
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公开(公告)号: US07720193B2公开(公告)日: 2010-05-18
- 发明人: Yoshiyuki Tani , Hiroshi Iwamoto , Takao Hisazumi , Yukihiro Iwata
- 申请人: Yoshiyuki Tani , Hiroshi Iwamoto , Takao Hisazumi , Yukihiro Iwata
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2005-241153 20050823
- 国际申请: PCT/JP2006/316283 WO 20060814
- 国际公布: WO2007/023751 WO 20070301
- 主分类号: G01N23/223
- IPC分类号: G01N23/223
摘要:
An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample 106, comprises a measurement step (S3) of irradiating the sample 106 with X-rays, and measuring the spectrum of the sample 106, and an assay step (S4) of comparing the components of the specific substance in the spectrum of the sample 106 and in a reference spectrum that has been pre-stored for the sample 106, and determining whether the specific substance is contained in the sample 106 in an amount equal to or greater than a specific value.
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