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发明授权
US07727481B2 Specimen holder having an insert for atomic force microscopy 有权
样品架具有用于原子力显微镜的插入件

Specimen holder having an insert for atomic force microscopy
摘要：
A specimen holder (10) is proposed in order to create a capability for preparing, in a cutting device, in particular a microtome or ultramicrotome, a specimen that is to examined in an AFM. The specimen holder (10) is embodied in several parts. It comprises an insert (12) in which the specimen is secured. Also provided is a receiving ring (14) in which the insert (12) can be received. The insert together with the receiving ring (14) is mounted, in particular thread-joined, on a base element (16). As a result of the mounting of the receiving ring (14) on the base element (16), the insert together with the specimen is fixed in its position.
摘要（中）：

提出了一种标本保持器（10），以便创建在切割装置中特别是切片机或超切片机，在AFM中检查的样本的能力。 样本保持器（10）被体现在几个部分中。 它包括其中固定有试样的插入件（12）。 还设置有可以接收插入件（12）的接收环（14）。 插入件与接收环（14）一起安装在基部元件（16）上，特别是螺纹接合。 由于将接收环（14）安装在基座元件（16）上，插入物与试样一起被固定在其位置上。

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