发明授权
US07742886B2 Systems and methods for analysis and design of radiating and scattering objects
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辐射和散射物体的分析和设计的系统和方法
- 专利标题: Systems and methods for analysis and design of radiating and scattering objects
- 专利标题(中): 辐射和散射物体的分析和设计的系统和方法
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申请号: US11985848申请日: 2007-11-16
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公开(公告)号: US07742886B2公开(公告)日: 2010-06-22
- 发明人: John Fredrick Shaeffer
- 申请人: John Fredrick Shaeffer
- 代理机构: Patrick Stellitano P.C.
- 主分类号: G06F7/60
- IPC分类号: G06F7/60
摘要:
Methods and apparatus for analysis and design of radiation and scattering objects are disclosed. In one embodiment, unknown sources are spatially grouped to produce a system interaction matrix with block factors of low rank within a given error tolerance and the unknown sources are determined from compressed forms of the factors.
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