发明授权
- 专利标题： Defect information managing method, information recording and/or reproducing apparatus, and information reproducing apparatus
- 专利标题（中）： 缺陷信息管理方法，信息记录和/或再现装置和信息再现装置
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申请号： US11455742申请日： 2006-06-20
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公开(公告)号： US07743307B2公开(公告)日： 2010-06-22
- 发明人: Minoru Akiyama , Hideki Takahashi , Akihito Ogawa , Chosaku Noda
- 申请人： Minoru Akiyama , Hideki Takahashi , Akihito Ogawa , Chosaku Noda
- 申请人地址： JP Tokyo JP Tokyo
- 专利权人： NEC Corporation,Kabushiki Kaisha Toshiba
- 当前专利权人： NEC Corporation,Kabushiki Kaisha Toshiba
- 当前专利权人地址： JP Tokyo JP Tokyo
- 代理机构： Sughrue Mion, PLLC
- 优先权： JP2005-180812 20050621
- 主分类号： G06F11/30
- IPC分类号： G06F11/30 ; G06F11/00 ; G11B20/10 ; G11B20/18
摘要：
In order to select the latest defect management information, the latest selection information first is selected by searching a plurality of selection information areas for a currently active selection information area in which the latest selection information is recorded and subsequently the latest defect management information is obtained by searching a plurality of defect management areas for a currently active defect management area in which the latest defect management information is recorded. If there is no unused defect management area in which defect management information can be alternatively recorded in lieu of the currently active defect management area, recording operation is limited.