发明授权
- 专利标题: Testing system for power supply
- 专利标题(中): 电源测试系统
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申请号: US11838245申请日: 2007-08-14
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公开(公告)号: US07746094B2公开(公告)日: 2010-06-29
- 发明人: Xin-Ping Zhang , Gui-Feng Xie
- 申请人: Xin-Ping Zhang , Gui-Feng Xie
- 申请人地址: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 专利权人: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 代理商 Frank R. Niranjan
- 优先权: CN200710200844 20070620
- 主分类号: G01R31/36
- IPC分类号: G01R31/36
摘要:
A testing system for a power supply (40) includes a testing chamber (10), a control switch, an electrical load (50), an AC source (60), and a PLC (30). The power supply has a voltage choice switch. The testing chamber receives the power supply therein. The testing chamber provides a first or a second ambient temperature and supplies a testing environment for the power supply. The control switch switches the power supply to operate between a standby state and an operational state. The electrical load is connected to the power supply. The AC source is connected to the power supply. The AC source outputs the first voltage or the second voltage to the power supply. The PLC controls switching states of the voltage choice switch and the control switch in a manner such that the power supply selectively operates in one of combined switching states of the voltage choice switch and the control switch.
公开/授权文献
- US20080314168A1 TESTING SYSTEM FOR POWER SUPPLY 公开/授权日:2008-12-25