发明授权
- 专利标题: Scanning probe microscope and method of operating the same
- 专利标题(中): 扫描探针显微镜及其操作方法
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申请号: US11486399申请日: 2006-07-13
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公开(公告)号: US07748052B2公开(公告)日: 2010-06-29
- 发明人: Hideo Kojima
- 申请人: Hideo Kojima
- 申请人地址: JP Tokyo
- 专利权人: JEOL Ltd.
- 当前专利权人: JEOL Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: The Webb Law Firm
- 优先权: JP2005-204031 20050713; JP2006-142187 20060523
- 主分类号: G01Q10/00
- IPC分类号: G01Q10/00 ; G01Q10/06
摘要:
A scanning probe microscope capable of preventing contact between the probe and a sample and a method of operating this microscope. The scanning probe microscope measures the topography of a surface of the sample by scanning the probe relative to the surface of the sample. A scanning reference position in the heightwise direction is updated in response to a maximum value of the height of the surface of the sample on the scan lines scanned so far. A limit value is set for motion of the probe in the heightwise direction relative to the scanning reference position. After the update, the next scan line is scanned. In this way, scanning is carried out along the successive scan lines.
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