发明授权
- 专利标题: Workpiece inspecting device
- 专利标题(中): 工件检查装置
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申请号: US12324856申请日: 2008-11-27
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公开(公告)号: US07748133B2公开(公告)日: 2010-07-06
- 发明人: Wei Liu
- 申请人: Wei Liu
- 申请人地址: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 专利权人: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 代理商 Frank R. Niranjan
- 优先权: CN200810301966.3 20080604
- 主分类号: G01B5/02
- IPC分类号: G01B5/02
摘要:
An exemplary workpiece inspecting device includes a base, a slider, a handle, a number of magnets, a number of probes and a measuring block. The slider is slidably mounted on the base and supports the handle thereon. The magnets are respectively embedded into the base for attracting and fixing a workpiece on the base. The probes are separately disposed on both the base and the slider for inspecting the perforations defined on a workpiece. The measuring block is attached on the slider for sliding and inspecting a thickness of the workpiece during the movement of the slider.
公开/授权文献
- US20090300932A1 WORKPIECE INSPECTING DEVICE 公开/授权日:2009-12-10
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