发明授权
- 专利标题: Semiconductor structure and method for manufacturing the same
- 专利标题(中): 半导体结构及其制造方法
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申请号: US12339371申请日: 2008-12-19
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公开(公告)号: US07750346B2公开(公告)日: 2010-07-06
- 发明人: Yu-Cheng Chen
- 申请人: Yu-Cheng Chen
- 申请人地址: TW Hsinchu
- 专利权人: Au Optronics Corp.
- 当前专利权人: Au Optronics Corp.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Thomas, Kayden, Horstemeyer & Risley
- 优先权: TW97125284A 20080704
- 主分类号: H01L29/04
- IPC分类号: H01L29/04 ; H01L31/036 ; H01L31/0376 ; H01L31/20
摘要:
A semiconductor structure and a method for manufacturing the same are provided. Compared to conventional structures of thin film transistors, the structure of the present invention uses a patterned first metal layer as a data line, and a patterned second metal layer as a gate line. In a thin film transistor, a gate is also located in the patterned first metal layer, and is electrically connected to the gate line located in the patterned second metal layer through a contact hole. A source and a drain of the thin film transistor are electrically connected to the data line through a contact hole. The structure of the present invention increases a storage capacitance and an aperture ratio.
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