发明授权
- 专利标题: Silicon germanium heterojunction bipolar transistor structure and method
- 专利标题(中): 硅锗异质结双极晶体管结构及方法
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申请号: US11741836申请日: 2007-04-30
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公开(公告)号: US07750371B2公开(公告)日: 2010-07-06
- 发明人: Oleg Gluschenkov , Rajendran Krishnasamy , Kathryn T. Schonenberg
- 申请人: Oleg Gluschenkov , Rajendran Krishnasamy , Kathryn T. Schonenberg
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Gibb I.P. Law Firm, LLC
- 代理商 Anthony Canale
- 主分类号: H01L29/76
- IPC分类号: H01L29/76 ; H01L29/94 ; H01L31/026 ; H01L31/113 ; H01L31/119
摘要:
Disclosed is an improved semiconductor structure (e.g., a silicon germanium (SiGe) hetero-junction bipolar transistor) having a narrow essentially interstitial-free SIC pedestal with minimal overlap of the extrinsic base. Also, disclosed is a method of forming the transistor which uses laser annealing, as opposed to rapid thermal annealing, of the SIC pedestal to produce both a narrow SIC pedestal and an essentially interstitial-free collector. Thus, the resulting SiGe HBT transistor can be produced with narrower base and collector space-charge regions than can be achieved with conventional technology.
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