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US07751034B2 Systems and methods for ray tracing 有权
射线跟踪的系统和方法

Systems and methods for ray tracing
摘要:
Systems and methods for evaluating an optical property of a gemstone operate to trace selected and ordered model light rays through a model of the gemstone. The rays may be selected such that, when ordered into a sequence, the points of contact of successive rays with the gemstone surface generate a pattern defined by a path created by the linking of successive contact points with line segments. Further, the rays may be propagated through the gemstone in a manner that utilizes an ordered set of facet identifiers corresponding to facets impinged upon by a ray previously propagated through the gemstone. Moreover, these strategies can be combined by propagating an ordered sequence of rays corresponding to an ordered set of contact points generating a pattern defined by a path, and using for such propagation an ordered set of facet identifiers corresponding to facets impinged upon by a ray previously propagated through the gemstone.
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