Invention Grant
- Patent Title: Methods for manufacturing optical fiber probe and for processing micromaterial
- Patent Title (中): 制造光纤探针和微加工材料的方法
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Application No.: US12007789Application Date: 2008-01-15
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Publication No.: US07754114B2Publication Date: 2010-07-13
- Inventor: Tadashi Mitsui , Hidetoshi Oikawa
- Applicant: Tadashi Mitsui , Hidetoshi Oikawa
- Applicant Address: JP Ibaraki
- Assignee: National Institute for Materials Science
- Current Assignee: National Institute for Materials Science
- Current Assignee Address: JP Ibaraki
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2002-170466 20020611
- Main IPC: B29D11/00
- IPC: B29D11/00 ; B29B9/14 ; B29B9/00

Abstract:
In a method for manufacturing an optical fiber probe in which an optical fiber is formed as an optical fiber probe by etching a tip section and sharpening a core region of the optical fiber, the optical fiber is a polarization maintaining optical fiber including the core region, a stress-applying region, and a clad region. The optical fiber probe is formed by mechanical-grinding of the edge of the optical fiber into a sharpened shape so that the core region is located at the tip of a sharpened portion, and by dipping the formed edge of the optical fiber in an etchant for further sharpening the core region. Accordingly, a new optical fiber probe both with high transmission efficiency and with a large polarization degree is obtained.
Public/Granted literature
- US20080121614A1 Methods for manufacturing optical fiber probe and for processing micromaterial Public/Granted day:2008-05-29
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