发明授权
- 专利标题: Transmission electron microscope
- 专利标题(中): 透射电子显微镜
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申请号: US12010702申请日: 2008-01-29
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公开(公告)号: US07755046B2公开(公告)日: 2010-07-13
- 发明人: Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
- 申请人: Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Stites & Harbison, PLLC
- 代理商 Juan Carlos A. Marquez, Esq.
- 优先权: JP2007-050921 20070301
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; G21K7/00
摘要:
Chirality distribution in the molecular structure of protein or the like and magnetic domain structure are analyzed with high resolution less than 10 nm. A transmission electron microscope equipped with a spin-polarized electron source is used for holography observation. The phase of transmission spin-polarized electrons changes due to the existence of chirality structure or magnetization in a sample, which is observed as an interference pattern phase shift in holography measurement.
公开/授权文献
- US20080210868A1 Transmission electron microscope 公开/授权日:2008-09-04
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