发明授权
- 专利标题: Driver circuit and test apparatus
- 专利标题(中): 驱动电路和测试仪器
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申请号: US11941086申请日: 2007-11-16
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公开(公告)号: US07755377B2公开(公告)日: 2010-07-13
- 发明人: Kensuke Kamo , Takashi Sekino , Toshiaki Awaji
- 申请人: Kensuke Kamo , Takashi Sekino , Toshiaki Awaji
- 申请人地址: JP
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP
- 代理机构: Chen Yoshimura LLP
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
摘要:
Provided is a driver circuit that has a first operational mode and a second operational mode and outputs an output signal according to an input signal. The driver circuit includes a first driver section that, in the first operational mode, generates and outputs the output signal according to the input signal and, in the second operational mode, is controlled to be disabled; a high precision driver section that, in the first operational mode, is controlled to be disabled and, in the second operational mode, outputs a source power having a predetermined voltage; and a second driver section that, in the first operational mode, receives the output signal output by the first driver section and outputs the received signal to the outside and, in the second operational mode, receives the source power from the high precision driver section, generates the output signal according to the input signal, and outputs the thus generated signal to the outside.
公开/授权文献
- US20090128182A1 DRIVER CIRCUIT AND TEST APPARATUS 公开/授权日:2009-05-21
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