发明授权
- 专利标题: Electronic measuring device
- 专利标题(中): 电子测量装置
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申请号: US11186365申请日: 2005-07-21
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公开(公告)号: US07756665B2公开(公告)日: 2010-07-13
- 发明人: Jeffrey L. Spanski , John C. Smith , Derek J. Nash , Daily Gist , Michael Williams , Raymond Wai-Man Chan , Desmond Wai Nang Tse , Hughes Sanoner
- 申请人: Jeffrey L. Spanski , John C. Smith , Derek J. Nash , Daily Gist , Michael Williams , Raymond Wai-Man Chan , Desmond Wai Nang Tse , Hughes Sanoner
- 申请人地址: US NC Huntersville
- 专利权人: Irwin Industrial Tool Company
- 当前专利权人: Irwin Industrial Tool Company
- 当前专利权人地址: US NC Huntersville
- 代理机构: Moore & Van Allen PLLC
- 代理商 Deborah H. Spencer
- 主分类号: G01B21/02
- IPC分类号: G01B21/02 ; G06F17/40
摘要:
An electronic measuring device that includes a transceiver device, a microprocessor operatively connected to the transceiver device, as well as a memory, an electronic output device, and a plurality of input mechanisms, all of which are operatively connected to the microprocessor. In some embodiments, the microprocessor may be programmed with logic that allows a user of the device to take and manipulate measurements using a menu-driven procedure by using the input mechanisms to select and activate desired operations.
公开/授权文献
- US20060089817A1 Electronic length measuring device 公开/授权日:2006-04-27
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