发明授权
- 专利标题: Ridge technique for fabricating an optical detector and an optical waveguide
- 专利标题(中): 用于制造光学检测器和光波导的脊技术
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申请号: US11514291申请日: 2006-08-31
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公开(公告)号: US07760980B2公开(公告)日: 2010-07-20
- 发明人: Lawrence C. West , Gregory L. Wojcik , Francisco A. Leon , Yonah Cho , Andreas Goebel
- 申请人: Lawrence C. West , Gregory L. Wojcik , Francisco A. Leon , Yonah Cho , Andreas Goebel
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Wilmerhale
- 主分类号: G02B6/10
- IPC分类号: G02B6/10 ; G02B6/13
摘要:
A method of fabricating on a substrate an optical detector in an optical waveguide, the method involving: forming at least one layer on a surface of the substrate, said at least one layer comprising SiGe; implanting an impurity into the at least one layer over a first area to form a detector region for the optical detector; etching into the at least one layer in a first region and a second region to form a ridge between the first and second regions, said ridge defining the optical detector and the optical waveguide; filling the first and second regions with a dielectric material having a lower refractive index than SiGe; and after filling the first and second regions with the dielectric material, removing surface material to form a planarized upper surface.
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