发明授权
US07764387B2 Apparatus and method for measuring suspension and head assemblies in a stack
有权
用于测量堆叠中的悬架和头部组件的装置和方法
- 专利标题: Apparatus and method for measuring suspension and head assemblies in a stack
- 专利标题(中): 用于测量堆叠中的悬架和头部组件的装置和方法
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申请号: US11713550申请日: 2007-03-02
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公开(公告)号: US07764387B2公开(公告)日: 2010-07-27
- 发明人: Mark T. Girard , Joseph P. Tracy , Ryan A. Jurgenson , David R. Swift
- 申请人: Mark T. Girard , Joseph P. Tracy , Ryan A. Jurgenson , David R. Swift
- 申请人地址: US MN Hutchinson
- 专利权人: Applied Kinetics, Inc.
- 当前专利权人: Applied Kinetics, Inc.
- 当前专利权人地址: US MN Hutchinson
- 代理机构: Kagan Binder, PLLC
- 主分类号: G01B11/14
- IPC分类号: G01B11/14 ; G01B11/26 ; G01C1/00 ; G01N21/86 ; G01V8/00
摘要:
An optical measurement device for determining at least two parameters of a measurement location of a surface of at least one workpiece positioned in a known coordinate system is described. The device comprises a first light source providing a first measurement beam. The first measurement beam is directed at a first surface of a workpiece. The device also comprises a second light source providing a second measurement beam. The second measurement beam is directed at a second surface of a workpiece facing opposite the first surface. Further, the device comprises a first system of receiving optics. The first system of receiving optics detects the incoming position of the first measurement beam. The first system of receiving optics is positioned on an opposite side of a workpiece from the first light source. Further still, the device comprises a second imaging system. The second system of receiving optics detects the incoming position of the second measurement beam. The second system of receiving optics is positioned on an opposite side of a workpiece from the second light source.