A system and method for automatically detecting cracks in components produced by a stamping process. A substantially uniform backlighting of the component can be produced, even when direct backlighting is partially blocked by structure used to support the component during inspection. One or more image detectors simultaneously image the component from a top side while it is backlit. One or more images of the current component are then compared to a master image of the component. Light passing through or visible through cracks in the component will cause the system to see a difference between the current image(s) of the component and the master image(s), thereby indicating a crack(s). A user is automatically notified upon detection of a crack.