Invention Grant
- Patent Title: Methods and devices for characterizing a surface
- Patent Title (中): 用于表征表面的方法和装置
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Application No.: US12132545Application Date: 2008-06-03
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Publication No.: US07765705B2Publication Date: 2010-08-03
- Inventor: Matthew J. Lawrence , Alexander F. Hoermann , David R. Mills , Scott P. Phillips , Scott J. Sharpe
- Applicant: Matthew J. Lawrence , Alexander F. Hoermann , David R. Mills , Scott P. Phillips , Scott J. Sharpe
- Applicant Address: US CA Mountain View
- Assignee: Areva Solar, Inc.
- Current Assignee: Areva Solar, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Patent Law Group LLP
- Agent Rachel V. Leiterman
- Main IPC: G01B7/34
- IPC: G01B7/34

Abstract:
A measuring device comprising a base, feet connected to the base, and an inclinometer mounted on the base is used to characterize a surface. The feet are placed in direct contact with the surface at a predetermined position. The inclinometer measures the angle of the surface relative to gravity at the predetermined position. In some embodiments, multiple measuring devices are connected to an arm, in order to measure different positions on the surface simultaneously. The arm may be moved by an actuator to the next predetermined position on the surface. In some embodiments, multiple measuring devices are connected to a frame that is substantially the same size as the surface to be characterized, such that the entire surface can be characterized without moving the frame.
Public/Granted literature
- US20090293293A1 Methods and Devices for Characterizing a Surface Public/Granted day:2009-12-03
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