Invention Grant
- Patent Title: Measuring apparatus
- Patent Title (中): 测量装置
-
Application No.: US12357090Application Date: 2009-01-21
-
Publication No.: US07765709B2Publication Date: 2010-08-03
- Inventor: Yutaka Nishitsuji , Yoshiharu Kimura
- Applicant: Yutaka Nishitsuji , Yoshiharu Kimura
- Applicant Address: JP Kanagawa
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Oliff & Berridge, PLC
- Priority: JP2008-017391 20080129
- Main IPC: G01B5/004
- IPC: G01B5/004 ; G01B3/00

Abstract:
A scale base is fixed to a base in a plurality of locations which are aligned in a measuring direction (a Y direction) in which measurement by a scale is carried out, slits are provided in the scale base in positions lying between the locations where the scale base is fixed to the base, the scale is supported by the scale base in two or more of the locations where the scale base is fixed to the base, and the scale base has gaps between the base and the scale base in positions other than the locations where the scale base is fixed to the base and between the scale and the scale base in the positions other than the locations where the scale base is fixed to the base.
Public/Granted literature
- US20090188122A1 MEASURING APPARATUS Public/Granted day:2009-07-30
Information query