Invention Grant
- Patent Title: High-frequency treating instrument for endoscope
- Patent Title (中): 高频内窥镜治疗仪
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Application No.: US11085512Application Date: 2005-03-22
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Publication No.: US07766908B2Publication Date: 2010-08-03
- Inventor: Teruo Ouchi
- Applicant: Teruo Ouchi
- Applicant Address: JP Tokyo
- Assignee: Hoya Coporation
- Current Assignee: Hoya Coporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPP2004-103982 20040331; JPP2004-151269 20040521
- Main IPC: A61B18/18
- IPC: A61B18/18

Abstract:
A high-frequency treating instrument for an endoscope, includes: a spatula-form high-frequency electrode which is adapted to be protruded from and housed within an insulated flexible sheath of the endoscope; and a concavo-convex portion which serves as an antiskid member when the concavo-convex portion is brought into contact with a mucous membrane and is formed on at least one of side edge portions of a portion closer to a tip end of the high-frequency electrode.
Public/Granted literature
- US20050222567A1 High-frequency treating instrument for endoscope Public/Granted day:2005-10-06
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