Invention Grant
US07767500B2 Superjunction device with improved ruggedness 有权
超强连接装置具有改善的耐用性

Superjunction device with improved ruggedness
Abstract:
An improved superjunction semiconductor device includes a charged balanced pylon in a body region, where a top of the pylon is large to create slight charge imbalance. A MOSgated structure is formed over the top of the pylon and designed to conduct current through the pylon. By increasing a dimension of the top of the pylon, the resulting device is less susceptible to variations in manufacturing tolerances to obtain a good breakdown voltage and improved device ruggedness.
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