Invention Grant
- Patent Title: Dummy vias for damascene process
- Patent Title (中): 用于大马士革过程的虚拟通孔
-
Application No.: US11457032Application Date: 2006-07-12
-
Publication No.: US07767570B2Publication Date: 2010-08-03
- Inventor: Kuei Shun Chen , Chin-Hsiang Lin , Vencent Chang , Lawrence Lin , Lai Chien Wen , Jhun Hua Chen
- Applicant: Kuei Shun Chen , Chin-Hsiang Lin , Vencent Chang , Lawrence Lin , Lai Chien Wen , Jhun Hua Chen
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method of making an integrated circuit includes providing a low-k dielectric layer on a substrate, the low-k dielectric layer including or adjacent to a plurality of conductive features; patterning the low-k dielectric layer to form trenches; patterning the low-k dielectric layer to form conductive vias and dummy vias, wherein each of the conductive vias is aligned with at least one of the plurality of the conductive features and at least one of the trenches, and each of the dummy vias is a distance above the plurality of conductive features; filling the trenches, conductive vias, and dummy vias using one or more conductive materials; and planarizing the conductive material(s).
Public/Granted literature
- US20070224795A1 DUMMY VIAS FOR DAMASCENE PROCESS Public/Granted day:2007-09-27
Information query
IPC分类: