Invention Grant
US07768116B2 Semiconductor package substrate having different thicknesses between wire bonding pad and ball pad and method for fabricating the same 有权
导线焊盘与球垫之间的厚度不同的半导体封装基板及其制造方法

Semiconductor package substrate having different thicknesses between wire bonding pad and ball pad and method for fabricating the same
Abstract:
Disclosed herein are a semiconductor package substrate and a method for fabricating the same. In the semiconductor package substrate, the circuit layer of the wire bonding pad side differs in thickness from that of the ball pad side to which a half etching process is applied. In addition, a connection through hole is constructed to provide an electrical connection between the plating lead lines on the wire bonding pad side and the ball pad side, thereby preventing electrical disconnection when the plating lead line of the wire bonding pad side is cut.
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