Invention Grant
US07768259B2 Device for non-destructive eddy current inspection of a hole formed in a conductive part
有权
用于在导电部件中形成的孔的非破坏性涡流检查装置
- Patent Title: Device for non-destructive eddy current inspection of a hole formed in a conductive part
- Patent Title (中): 用于在导电部件中形成的孔的非破坏性涡流检查装置
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Application No.: US12123029Application Date: 2008-05-19
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Publication No.: US07768259B2Publication Date: 2010-08-03
- Inventor: Patrick Cabanis , Sandra Carole Angele Cheynet , Patrick Gaisnon , Christian Le Corre
- Applicant: Patrick Cabanis , Sandra Carole Angele Cheynet , Patrick Gaisnon , Christian Le Corre
- Applicant Address: FR Paris
- Assignee: SNECMA
- Current Assignee: SNECMA
- Current Assignee Address: FR Paris
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR0755290 20070529
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G01N27/90
Abstract:
Using eddy currents to inspect a hole that is possibly not rectilinear and/or of section that is not circular. The inspection device comprises a stick shaped and dimensioned to be capable of being engaged in said hole, at least one arm hinged to a support fastened to one end of the stick, an eddy current sensor being embedded in said arm, and resilient means for urging the arm outwards against the inside surface of the hole.
Public/Granted literature
- US20080297148A1 DEVICE FOR NON-DESTRUCTIVE EDDY CURRENT INSPECTION OF A HOLE FORMED IN A CONDUCTIVE PART Public/Granted day:2008-12-04
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