Systems and methods for identifying problems with PZT elements of micro-actuators are provided. In certain example embodiments, a voltage (e.g., a sine voltage) may be applied to a reference unit causing it as well as a test unit to vibrate. Characteristics of the respective resonances (e.g., frequency, amplitude, phase, etc.) may be compared (e.g., by a processor) to determine whether there are problems with the test unit. The reference unit may include an HGA or an HSA of a hard disk drive device. The test unit may include corresponding parts for inspection. Such techniques make it possible to detect problems with PZT elements when there is only one PZT element per micro-actuator.