Invention Grant
- Patent Title: Apparatus, circuit and method of monitoring performance
- Patent Title (中): 仪器,电路及监控方法
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Application No.: US12292138Application Date: 2008-11-12
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Publication No.: US07768303B2Publication Date: 2010-08-03
- Inventor: Mikihiro Kajita
- Applicant: Mikihiro Kajita
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2007-337737 20071227
- Main IPC: H03K19/173
- IPC: H03K19/173

Abstract:
An apparatus includes a first sequential circuit which captures an input signal according to a first clock signal, a second sequential circuit which captures the input signal according to a second clock signal and outputs the captured input signal to a logic circuit, the second clock signal being modulated so that a period of the second clock signal is shorter than that of the first clock signal, a third sequential circuit which captures an output signal of the logic circuit according to the second clock signal, and a verification circuit which verifies whether an output signal of the first sequential circuit and an output signal of the third sequential circuit match with each other.
Public/Granted literature
- US20090167360A1 Apparatus, circuit and method of monitoring performance Public/Granted day:2009-07-02
Information query
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