Invention Grant
- Patent Title: Multiple surface inspection system and method
- Patent Title (中): 多表面检查系统和方法
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Application No.: US11732888Application Date: 2007-04-05
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Publication No.: US07768633B2Publication Date: 2010-08-03
- Inventor: Ajharali Amanullah , Han Cheng Ge , Huek Choy Tan , Hing Tim Lai
- Applicant: Ajharali Amanullah , Han Cheng Ge , Huek Choy Tan , Hing Tim Lai
- Applicant Address: SG Singapore
- Assignee: ASTI Holdings Limited
- Current Assignee: ASTI Holdings Limited
- Current Assignee Address: SG Singapore
- Agency: Jackson Walker L.L.P.
- Agent Christopher J. Rourk
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A system for inspecting components is provided. The system includes a prism having a first end, a second end, a first reflecting surface, and a second reflecting surface. The first end of the prism is located in a plane that is parallel to and axially separated from a plane of one or more of a plurality of inspection pieces. An image data system is disposed beyond the second end of the prism and generates image data of one or more of the inspection piece that includes a top surface of at least one of the inspection pieces and at least one side of at least one of the inspection pieces. An inspection piece transportation system, such as a pick and place tool or conveyor, moves a plurality of inspection pieces past the first end of the prism through an inspection area.
Public/Granted literature
- US20080246958A1 Multiple surface inspection system and method Public/Granted day:2008-10-09
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