Invention Grant
- Patent Title: Optical fly height measurement
- Patent Title (中): 光飞高度测量
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Application No.: US11834772Application Date: 2007-08-07
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Publication No.: US07768657B2Publication Date: 2010-08-03
- Inventor: Xuhui Jin , Amit Itagi , William Albert Challener
- Applicant: Xuhui Jin , Amit Itagi , William Albert Challener
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Agency: Pietragallo Gordon Alfano Bosick & Raspanti, LLP
- Agent Benjamin T. Queen, II
- Main IPC: G01B11/14
- IPC: G01B11/14

Abstract:
An optical fly height measurement system includes a planar waveguide, a first diffraction grating for coupling an electromagnetic wave into the planar waveguide wherein the first diffraction grating is positioned for directing the electromagnetic wave towards an air bearing surface of a slider. A second diffraction grating is provided for receiving the electromagnetic wave reflected from the air bearing surface. A detector module and processor are provided to determine the fly height.
Public/Granted literature
- US20090040531A1 Optical Fly Height Measurement Public/Granted day:2009-02-12
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