Invention Grant
- Patent Title: Spectrally resolved fast monitor
- Patent Title (中): 光谱解析快速监视器
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Application No.: US12185893Application Date: 2008-08-05
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Publication No.: US07768697B2Publication Date: 2010-08-03
- Inventor: Daniel Al-Salameh , David J. Dougherty
- Applicant: Daniel Al-Salameh , David J. Dougherty
- Applicant Address: US CA Milpitas
- Assignee: JDS Uniphase Corporation
- Current Assignee: JDS Uniphase Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Pequignot + Myers LLC
- Agent Matthew A. Pequiognot
- Main IPC: H01S3/00
- IPC: H01S3/00

Abstract:
A method and apparatus for monitoring spectral tilt uses an arrayed waveguide grating (AWG) to separate a multiplexed optical signal having a plurality of wavelength channels into a plurality of sub-bands, where each sub-band spans a different wavelength range and includes more than one wavelength channel. A photodetector array is provided to measure the optical power in each of the sub-bands, while control electronics calculate spectral tilt of the multiplexed optical signal using the measured optical power in each of the sub-bands. The spectral tilt monitor in accordance with the instant invention provides spectral resolution, increased monitoring speeds, and decreased manufacturing costs.
Public/Granted literature
- US20090003767A1 Spectrally Resolved Fast Monitor Public/Granted day:2009-01-01
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