Invention Grant
US07768759B2 Control circuit of semiconductor device having over-heat protecting function
有权
具有过热保护功能的半导体器件的控制电路
- Patent Title: Control circuit of semiconductor device having over-heat protecting function
- Patent Title (中): 具有过热保护功能的半导体器件的控制电路
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Application No.: US12155078Application Date: 2008-05-29
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Publication No.: US07768759B2Publication Date: 2010-08-03
- Inventor: Hiroo Yabe , Kazuhiro Kubota , Masato Sasahara
- Applicant: Hiroo Yabe , Kazuhiro Kubota , Masato Sasahara
- Applicant Address: JP Tokyo
- Assignee: Yazaki Corporation
- Current Assignee: Yazaki Corporation
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JPP2007-155456 20070612
- Main IPC: H02H5/04
- IPC: H02H5/04

Abstract:
A control circuit of a semiconductor device includes: a semiconductor element which supplies an electric power to a load; an over-heat protecting unit having: a temperature detecting section which detects a rise in temperature; a latch section which holds an output of the temperature detecting section; and a gate interrupting section which interrupts an input to a gate of the semiconductor element in accordance with the output of the latch section; a control unit which supplies a PWM signal for turning on/off the semiconductor element; a driving electric power supply unit which supplies a driving electric power for driving the over-heat protecting unit; and a timer unit which allows the driving electric power supply unit to supply the driving electric power for a predetermined period when the input to the gate of the semiconductor element is interrupted and the control unit stops to supply the PWM signal.
Public/Granted literature
- US20080310068A1 Control circuit of semiconductor device having over-heat protecting function Public/Granted day:2008-12-18
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