Invention Grant
- Patent Title: Phase change memory device and operating method thereof
- Patent Title (中): 相变存储器件及其操作方法
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Application No.: US12146522Application Date: 2008-06-26
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Publication No.: US07768823B2Publication Date: 2010-08-03
- Inventor: Hee Bok Kang , Suk Kyoung Hong
- Applicant: Hee Bok Kang , Suk Kyoung Hong
- Applicant Address: KR Kyoungki-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Kyoungki-do
- Agency: Ladas & Parry LLP
- Priority: KR10-2007-0080671 20070810
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A phase change memory device and operation is described where the phase change memory device includes a phase change resistance cell storing data corresponding to a sensed crystallization state. The phase change memory device operates by reading data of a selected phase change resistance cell when in a write mode. The data to be written is compared to the read data. If the read data is different from the data to be written, it is determined whether the data to be written is a first data. An operation writing and verifying the first data in the cell under a first operating condition when the is data to be written is the first data is then performed. After performing verification, if the read data is different from the first data, the first data is written and verified in the selected phase change resistance cell under a second operating condition.
Public/Granted literature
- US20090040813A1 PHASE CHANGE MEMORY DEVICE AND OPERATING METHOD THEREOF Public/Granted day:2009-02-12
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