Invention Grant
US07768830B2 Semiconductor memory device capable of correcting a read level properly
有权
能够正确地校正读取电平的半导体存储器件
- Patent Title: Semiconductor memory device capable of correcting a read level properly
- Patent Title (中): 能够正确地校正读取电平的半导体存储器件
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Application No.: US12416750Application Date: 2009-04-01
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Publication No.: US07768830B2Publication Date: 2010-08-03
- Inventor: Noboru Shibata , Hiroshi Sukegawa
- Applicant: Noboru Shibata , Hiroshi Sukegawa
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-152660 20060531
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
In a memory cell array, a plurality of memory cells each of which stores a plurality of bits are connected to a plurality of word lines and a plurality of bit lines and are arranged in a matrix. Control portions read a threshold level of a second memory cell adjacent to a first memory cell in the memory cell array, determine a correction level according to the threshold level read from the second memory cell, add the determined correction level to a read level of the first memory cell, and then read the threshold level of the first memory cell. A storage portion stores the correction level.
Public/Granted literature
- US20090190399A1 SEMICONDUCTOR MEMORY DEVICE CAPABLE OF CORRECTING A READ LEVEL PROPERLY Public/Granted day:2009-07-30
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