Invention Grant
- Patent Title: Precharge control circuit in semiconductor memory apparatus
- Patent Title (中): 半导体存储装置中的预充电控制电路
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Application No.: US12026415Application Date: 2008-02-05
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Publication No.: US07768852B2Publication Date: 2010-08-03
- Inventor: Seong Nyuh Yoo
- Applicant: Seong Nyuh Yoo
- Applicant Address: KR
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR
- Agency: Baker & McKenzie LLP
- Priority: KR10-2007-0089884 20070905
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A precharge circuit in a semiconductor memory apparatus includes a burst setting unit for controlling a state of a burst setting signal using delay elements in response to a burst start signal, wherein the delay elements operate in synchronization with a clock signal when the burst setting signal is deactivated, a burst termination unit for generating a burst termination signal in response to the burst setting signal, a precharge control unit for generating a read precharge control signal and a write precharge control signal in response to the burst termination signal, and a precharge signal generating unit for generating a precharge signal using the read precharge control signal or the write precharge control signal according to a read or write operation.
Public/Granted literature
- US20090059700A1 PRECHARGE CONTROL CIRCUIT IN SEMICONDUCTOR MEMORY APPARATUS Public/Granted day:2009-03-05
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