Invention Grant
- Patent Title: Material analysis based on imaging effective atomic numbers
- Patent Title (中): 基于成像有效原子数的材料分析
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Application No.: US12048002Application Date: 2008-03-13
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Publication No.: US07769132B1Publication Date: 2010-08-03
- Inventor: Paul J. Hurd , Jeff Stillson
- Applicant: Paul J. Hurd , Jeff Stillson
- Applicant Address: US MA Woburn
- Assignee: L-3 Communications Security and Detection Systems, Inc.
- Current Assignee: L-3 Communications Security and Detection Systems, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Fish & Richardson P.C.
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
Effective atomic numbers associated with pixels in a region are received. An effective atomic number is associated with each pixel in the region. X-ray data for the region is received, and an item within the region is identified from the x-ray data. Some of the pixels in the region are correlated with the item such that the item is associated with an effective atomic number. An image of the region is rendered. The pixels of the item have a display style based on the effective atomic number of the item.
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