Invention Grant
- Patent Title: Statistical quality assessment of fingerprints
- Patent Title (中): 指纹统计质量评估
-
Application No.: US12349205Application Date: 2009-01-06
-
Publication No.: US07769212B2Publication Date: 2010-08-03
- Inventor: Kyungtae Hwang , Nam-Deuk Kim
- Applicant: Kyungtae Hwang , Nam-Deuk Kim
- Applicant Address: US MA Burlington
- Assignee: L-1 Secure Credentialing, Inc.
- Current Assignee: L-1 Secure Credentialing, Inc.
- Current Assignee Address: US MA Burlington
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
The present invention relates generally to human fingerprints. More specifically the present invention relates to assessing the quality of a fingerprint image. An assessment is made by analyzing characteristics of image sub-regions. For example, the characteristics may include statistics that are associated with a sub-region. If a sub-region is found to have unacceptable characteristics, it can be modified through a morphological operation to compensate for the unacceptable characteristics.
Public/Granted literature
- US20090196469A1 Statistical Quality Assessment of Fingerprints Public/Granted day:2009-08-06
Information query