Invention Grant
- Patent Title: Method and apparatus for image inspection
- Patent Title (中): 图像检查方法和装置
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Application No.: US11587559Application Date: 2005-04-19
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Publication No.: US07769243B2Publication Date: 2010-08-03
- Inventor: Isao Shimizu
- Applicant: Isao Shimizu
- Applicant Address: JP Saitama
- Assignee: Japan Science and Technology Agency
- Current Assignee: Japan Science and Technology Agency
- Current Assignee Address: JP Saitama
- Agency: Rader, Fishman & Grauer PLLC
- Priority: JP2004-130734 20040427
- International Application: PCT/JP2005/007468 WO 20050419
- International Announcement: WO2005/106437 WO 20051110
- Main IPC: G06K9/40
- IPC: G06K9/40

Abstract:
An image checking process wherein only a defective or differential portion of a checked image is displayed together with its position and wherein no pre-processing is required for image positioning. A computer (3) captures a reference image or Fourier transformed image thereof from a storage part, a CCD camera (1) or a CCD camera (2) to acquire intensity information and phase information, and also captures an identified image or Fourier transformed image thereof from the storage part, CCD camera (1) or CCD camera (2) to acquire intensity information of the Fourier transformed image of the identified image. Then, the computer (3) determines the difference in intensity information between the reference image and the Fourier transformed image of the identified image and further determines an inverse Fourier transformed image of an expression obtained from the determined differential intensity information and the phase information of the reference image to output the inverse Fourier transformed image to an output part or display part. The inverse Fourier transformed image is used to extract, as a difference between the identified image and the reference image, an image defect of the identified image or the image difference between the identified image and the reference image.
Public/Granted literature
- US20070230819A1 Method and Apparatues for Image Inspection Public/Granted day:2007-10-04
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