发明授权
- 专利标题: Method and apparatus for image inspection
- 专利标题(中): 图像检查方法和装置
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申请号: US11587559申请日: 2005-04-19
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公开(公告)号: US07769243B2公开(公告)日: 2010-08-03
- 发明人: Isao Shimizu
- 申请人: Isao Shimizu
- 申请人地址: JP Saitama
- 专利权人: Japan Science and Technology Agency
- 当前专利权人: Japan Science and Technology Agency
- 当前专利权人地址: JP Saitama
- 代理机构: Rader, Fishman & Grauer PLLC
- 优先权: JP2004-130734 20040427
- 国际申请: PCT/JP2005/007468 WO 20050419
- 国际公布: WO2005/106437 WO 20051110
- 主分类号: G06K9/40
- IPC分类号: G06K9/40
摘要:
An image checking process wherein only a defective or differential portion of a checked image is displayed together with its position and wherein no pre-processing is required for image positioning. A computer (3) captures a reference image or Fourier transformed image thereof from a storage part, a CCD camera (1) or a CCD camera (2) to acquire intensity information and phase information, and also captures an identified image or Fourier transformed image thereof from the storage part, CCD camera (1) or CCD camera (2) to acquire intensity information of the Fourier transformed image of the identified image. Then, the computer (3) determines the difference in intensity information between the reference image and the Fourier transformed image of the identified image and further determines an inverse Fourier transformed image of an expression obtained from the determined differential intensity information and the phase information of the reference image to output the inverse Fourier transformed image to an output part or display part. The inverse Fourier transformed image is used to extract, as a difference between the identified image and the reference image, an image defect of the identified image or the image difference between the identified image and the reference image.
公开/授权文献
- US20070230819A1 Method and Apparatues for Image Inspection 公开/授权日:2007-10-04
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