Invention Grant
- Patent Title: Electrooptic probe for measuring temperature and electromagnetic field
- Patent Title (中): 用于测量温度和电磁场的电光探头
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Application No.: US12305068Application Date: 2007-06-15
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Publication No.: US07769250B2Publication Date: 2010-08-03
- Inventor: Lionel Duvillaret , Gwenaël Gaborit
- Applicant: Lionel Duvillaret , Gwenaël Gaborit
- Applicant Address: FR Grenoble FR Chambery
- Assignee: Institut National Polytechnique de Grenoble,Universite de Savoie
- Current Assignee: Institut National Polytechnique de Grenoble,Universite de Savoie
- Current Assignee Address: FR Grenoble FR Chambery
- Agency: Howard IP Law Group, PC
- Priority: FR0652156 20060616
- International Application: PCT/FR2007/051444 WO 20070615
- International Announcement: WO2007/144546 WO 20071221
- Main IPC: G02B6/00
- IPC: G02B6/00

Abstract:
A device for measuring an electromagnetic field and the temperature in an analysis zone includes a light source for sending a light beam into a polarization-maintaining optical fiber. The light beam is directed along one axis of the fiber. An anisotropic electrooptic material is placed in the zone for receiving the beam from optical fiber and for sending the beam into the fiber. The device further includes an arrangement for analyzing the intensity of the linear wave and a mechanism for determining the variations in the orientation of the linear wave output by phase-shifting means. A quarter-wave plate is inserted between the optical fiber and the crystal, wherein the plate has its axes oriented at substantially 45° to the axes of the optical fiber.
Public/Granted literature
- US20090274410A1 ELECTROOPTIC PROBE FOR MEASURING TEMPERATURE AND ELECTROMAGNETIC FIELD Public/Granted day:2009-11-05
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