Invention Grant
US07769372B1 Selectively activated multi-subcarrier (SAMS) radio transceiver measuring techniques
有权
选择性激活多子载波(SAMS)无线电收发器测量技术
- Patent Title: Selectively activated multi-subcarrier (SAMS) radio transceiver measuring techniques
- Patent Title (中): 选择性激活多子载波(SAMS)无线电收发器测量技术
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Application No.: US10887243Application Date: 2004-07-08
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Publication No.: US07769372B1Publication Date: 2010-08-03
- Inventor: Hee Wong
- Applicant: Hee Wong
- Applicant Address: US CA Santa Clara
- Assignee: National Semiconductor Corporation
- Current Assignee: National Semiconductor Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: H04W24/00
- IPC: H04W24/00

Abstract:
Testing of a wireless transceiver employs a selectively activated multi-subcarrier test vector or corresponding waveform for which all subcarriers are activated except subcarriers below a selected subcarrier fundamental and harmonics of the selected subcarrier fundamental. Use of selectively activated multi-subcarrier testing allows measurement of inter-modulation distortion, harmonic distortion, frequency response, and phase noise using a common spectrum analyzer, with individual results pinpointing sources of impairment.
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