Invention Grant
US07769372B1 Selectively activated multi-subcarrier (SAMS) radio transceiver measuring techniques 有权
选择性激活多子载波(SAMS)无线电收发器测量技术

  • Patent Title: Selectively activated multi-subcarrier (SAMS) radio transceiver measuring techniques
  • Patent Title (中): 选择性激活多子载波(SAMS)无线电收发器测量技术
  • Application No.: US10887243
    Application Date: 2004-07-08
  • Publication No.: US07769372B1
    Publication Date: 2010-08-03
  • Inventor: Hee Wong
  • Applicant: Hee Wong
  • Applicant Address: US CA Santa Clara
  • Assignee: National Semiconductor Corporation
  • Current Assignee: National Semiconductor Corporation
  • Current Assignee Address: US CA Santa Clara
  • Main IPC: H04W24/00
  • IPC: H04W24/00
Selectively activated multi-subcarrier (SAMS) radio transceiver measuring techniques
Abstract:
Testing of a wireless transceiver employs a selectively activated multi-subcarrier test vector or corresponding waveform for which all subcarriers are activated except subcarriers below a selected subcarrier fundamental and harmonics of the selected subcarrier fundamental. Use of selectively activated multi-subcarrier testing allows measurement of inter-modulation distortion, harmonic distortion, frequency response, and phase noise using a common spectrum analyzer, with individual results pinpointing sources of impairment.
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