Invention Grant
US07769556B2 Method for correcting measuring errors caused by the lens distortion of an objective
有权
用于校正由物镜的镜头失真引起的测量误差的方法
- Patent Title: Method for correcting measuring errors caused by the lens distortion of an objective
- Patent Title (中): 用于校正由物镜的镜头失真引起的测量误差的方法
-
Application No.: US12231481Application Date: 2008-09-03
-
Publication No.: US07769556B2Publication Date: 2010-08-03
- Inventor: Michael Heiden , Klaus-Dieter Adam
- Applicant: Michael Heiden , Klaus-Dieter Adam
- Applicant Address: DE Weilburg
- Assignee: Vistec Semiconductor Systems GmbH
- Current Assignee: Vistec Semiconductor Systems GmbH
- Current Assignee Address: DE Weilburg
- Agency: Davidson, Davidson & Kappel, LLC
- Priority: DE102007042272 20070906
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01B11/03 ; G06K9/00 ; G01N21/00

Abstract:
A method for correcting the measuring errors caused by the lens distortion of an objective in a coordinate measuring machine is disclosed. For a plurality of different types of structures, the lens distortion caused by an objective is determined in an image field of the objective. The position of a type of structure is determined in the image field of the objective by a measuring window. The correction of the lens distortion required for the type of structure to be measured is retrieved from the database as a function of the type of structure to be measured.
Public/Granted literature
- US20090070059A1 Method for correcting measuring errors caused by the lens distortion of an objective Public/Granted day:2009-03-12
Information query