Invention Grant
- Patent Title: Test automation via RFID technology
- Patent Title (中): 通过RFID技术测试自动化
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Application No.: US11766360Application Date: 2007-06-21
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Publication No.: US07770070B2Publication Date: 2010-08-03
- Inventor: Alberto Rodriguez , Heiko Rommelmann , Steven T. Reczek
- Applicant: Alberto Rodriguez , Heiko Rommelmann , Steven T. Reczek
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Agency: Gibb I.P. Law Firm, LLC
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method and system receives test requirements and test settings in order to design a test. An identifier is assigned to the test that was designed and the test is stored in a database using the identifier to identify the test. In addition, the test is printed on at least one sheet or form and a wireless read/write device is programmed with the identifier assigned to the test. The wireless read/write device is attached to the sheet on which the test was printed. Thus, the sheet and the wireless read/write device can be provided to a test operator to allow the test operator to wirelessly read the identifier from the wireless read/write device. Then, the test operator can access the test from the database based on the identifier read from the wireless read/write device. The test instructions (comprising the test requirements and test settings) are provided from the database to the operator to perform the test and potentially produce a physical test output. The test instructions are provided to the operator through a graphic user interface.
Public/Granted literature
- US20080320335A1 Test Automation Via RFID Technology Public/Granted day:2008-12-25
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