Invention Grant
- Patent Title: Semiconductor integrated circuit and test method therefor
- Patent Title (中): 半导体集成电路及其测试方法
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Application No.: US11797527Application Date: 2007-05-04
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Publication No.: US07770082B2Publication Date: 2010-08-03
- Inventor: Kentaro Teranishi
- Applicant: Kentaro Teranishi
- Applicant Address: JP Tokyo
- Assignee: Toshiba Matsushita Display Technology Co., Ltd.
- Current Assignee: Toshiba Matsushita Display Technology Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2006-137753 20060517
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/26 ; G11C29/00

Abstract:
A first path for directly inputting a control signal from the outside to a data signal processor and a second path for inputting a control signal generated by a bus interface to the data signal processor can be selectively switched by a switching portion. At the test time of a timing controller, the first path is selected by the switching portion so that the control signal is directly input to the data signal processor without being passed through the bus interface having a slow operation clock, and thus the timing controller can be reliably tested. At the normal use time, the second path is selected by the switching portion, thereby the control signal is input via the bus interface to various kinds of processors such as the data signal processor, and thus the normal operation can be reliably treated.
Public/Granted literature
- US20070271488A1 Semiconductor integrated circuit and test method therefor Public/Granted day:2007-11-22
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