Invention Grant
- Patent Title: Package structure for integrated circuit device
- Patent Title (中): 集成电路器件封装结构
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Application No.: US12116152Application Date: 2008-05-06
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Publication No.: US07772698B2Publication Date: 2010-08-10
- Inventor: Lu-Chen Hwan , Yu-Lin Ma , P. C. Chen
- Applicant: Lu-Chen Hwan , Yu-Lin Ma , P. C. Chen
- Applicant Address: TW Xinzhuang
- Assignee: Mutual-Pak Technology Co., Ltd.
- Current Assignee: Mutual-Pak Technology Co., Ltd.
- Current Assignee Address: TW Xinzhuang
- Agency: Snell & Wilmer L.L.P.
- Priority: TW96116302A 20070508
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40 ; H01L23/28 ; H01L23/02

Abstract:
A package structure for packaging at least one of a plurality of integrated circuit devices of a wafer is provided. The package structure includes an extension metal pad, a first conductive bump and an insulator layer. The extension metal pad electrically contacts the at least one of the plurality of integrated circuit devices. The first conductive bump is located on the extension metal pad. The insulator layer is located over the at least one of the plurality of integrated circuit devices and on a sidewall of it.
Public/Granted literature
- US20080277785A1 PACKAGE STRUCTURE FOR INTEGRATED CIRCUIT DEVICE AND METHOD OF THE SAME Public/Granted day:2008-11-13
Information query
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