发明授权
- 专利标题: Immersion photolithography monitoring
- 专利标题(中): 浸渍光刻监测
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申请号: US11680762申请日: 2007-03-01
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公开(公告)号: US07777894B2公开(公告)日: 2010-08-17
- 发明人: Jae-Hyun Kim , Wang-Cheol Zin , Jung-Hoon Kim
- 申请人: Jae-Hyun Kim , Wang-Cheol Zin , Jung-Hoon Kim
- 申请人地址: KR Suwon-Si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-Si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2006-0073308 20060803
- 主分类号: G01N21/41
- IPC分类号: G01N21/41 ; G01N21/43
摘要:
A method and apparatus are provided for monitoring an immersion photolithography process, the method including supplying an immersion fluid having an initial refractive index, performing photolithography using the supplied immersion fluid, recovering the used immersion fluid; and the apparatus including a light source, one or more fluid passageways disposed relative to the light source, and a light detector disposed on an opposite side of the fluid passageways relative to the light source for measuring a refractive index of a fluid in the fluid passageways.
公开/授权文献
- US20080030693A1 IMMERSION PHOTOLITHOGRAPHY MONITORING 公开/授权日:2008-02-07
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