发明授权
- 专利标题: Optical emission analysis apparatus
- 专利标题(中): 光发射分析仪
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申请号: US11686103申请日: 2007-03-14
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公开(公告)号: US07778007B2公开(公告)日: 2010-08-17
- 发明人: Eizo Kawato
- 申请人: Eizo Kawato
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: J.C. Patents
- 优先权: JP2006-115114 20060419
- 主分类号: F23Q3/00
- IPC分类号: F23Q3/00
摘要:
An optical emission analysis apparatus includes a discharge gap, an ignitor circuit, and a main discharge power supply. The ignitor circuit includes an ignition transformer, a pair of current control devices, and an excitation power supply. On a secondary coil of the ignition transformer, the discharge gap and the main discharge power supply are connected in series to form a main discharge current path. On a primary coil of the ignition transformer, the pair of current control devices and the excitation power supply are connected in series to form an excitation current path. A pair of current control devices is connected to each other via mutually opposite polarities. The polarity of the high voltage generated in the secondary coil is reversed by reversing the polarity of the voltage of the excitation power supply. The direction of the main discharge current is reversed by reversing the polarity of the voltage of the main discharge power supply. Through the reverse polarity discharge, the deposits on the electrode are removed.
公开/授权文献
- US20070247621A1 OPTICAL EMISSION ANALYSIS APPARATUS 公开/授权日:2007-10-25
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