A measuring arrangement comprises a radiation device (SE), having at least one first surface emitting semiconductor component (1) with a vertical emission direction, a detection device (DE) for detecting reflected radiation, and an evaluation circuit (AS), set up for controlling the radiation device (SE) and the detection device (DE) and for processing a detection result of the detection device (DE). The semiconductor component (1) comprises a semiconductor body (2) with a plurality of active regions (4a, 4b) suitable for generating radiation and arranged at a distance from one another in a vertical direction. In this case, a tunnel junction (5) is monolithically integrated in the semiconductor body (2) between two active regions (4a, 4b) and the two active regions (4a, 4b) are electrically conductively connected by means of the tunnel junction during operation of the semiconductor component (1).