发明授权
US07782107B2 Method and apparatus for an event tolerant storage circuit 有权
容错存储电路的方法和装置

  • 专利标题: Method and apparatus for an event tolerant storage circuit
  • 专利标题(中): 容错存储电路的方法和装置
  • 申请号: US12165578
    申请日: 2008-06-30
  • 公开(公告)号: US07782107B2
    公开(公告)日: 2010-08-24
  • 发明人: Anand Dixit
  • 申请人: Anand Dixit
  • 申请人地址: US CA Redwood City
  • 专利权人: Oracle America, Inc.
  • 当前专利权人: Oracle America, Inc.
  • 当前专利权人地址: US CA Redwood City
  • 代理机构: Polsinelli Shughart PC
  • 代理商 Gregory P. Durbin
  • 主分类号: H03K3/356
  • IPC分类号: H03K3/356
Method and apparatus for an event tolerant storage circuit
摘要:
An apparatus for an event tolerant circuit including a latch. The event tolerant circuit may maintain correct data values even after the occurrence of an event such as a soft error. The event tolerant circuit may introduce a delay in a feedback loop, thereby passing the glitch value to an element in the feedback loop at different times, thus preventing the propagation of the glitch through the event tolerant circuit.
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