发明授权
- 专利标题： Parameter scanning for signal over-sampling
- 专利标题（中）： 信号过采样参数扫描
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申请号： US11856640申请日： 2007-09-17
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公开(公告)号： US07782934B2公开(公告)日： 2010-08-24
- 发明人: Hoon Choi
- 申请人： Hoon Choi
- 申请人地址： US CA Sunnyvale
- 专利权人： Silicon Image, Inc.
- 当前专利权人： Silicon Image, Inc.
- 当前专利权人地址： US CA Sunnyvale
- 代理机构： Blakely Sokoloff Taylor & Zafman
- 主分类号： H03H7/30
- IPC分类号： H03H7/30
摘要：
A method and apparatus for parameter scanning for signal over-sampling. An embodiment of an apparatus includes an equalizer to equalize received data values, and a sampler to over-sample the equalized data. The apparatus includes an eye monitor to generate information regarding quality of signal eyes for the over-sampled data, and an equalization monitor to generate information regarding sufficiency of signal equalization. The apparatus further includes a scan engine to scan possible values of a plurality of parameters for the apparatus.
公开/授权文献
- US20080069196A1 PARAMETER SCANNING FOR SIGNAL OVER-SAMPLING 公开/授权日：2008-03-20
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