发明授权
US07789477B2 Method for testing integrity of a base for printhead integrated circuitry
有权
用于测试打印头集成电路基座完整性的方法
- 专利标题： Method for testing integrity of a base for printhead integrated circuitry
- 专利标题（中）： 用于测试打印头集成电路基座完整性的方法
-
申请号： US12193726申请日： 2008-08-19
-
公开(公告)号： US07789477B2公开(公告)日： 2010-09-07
- 发明人: Stephen John Sleijpen , Joseph Tharion , Jan Waszczuk , Eric Patrick O'Donnell , William Granger , David Bernardi , Stephen Richard O'Farrell , Jason Mark Thelander
- 申请人： Stephen John Sleijpen , Joseph Tharion , Jan Waszczuk , Eric Patrick O'Donnell , William Granger , David Bernardi , Stephen Richard O'Farrell , Jason Mark Thelander
- 申请人地址： AU Balmain, New South Wales
- 专利权人： Silverbrook Research Pty Ltd
- 当前专利权人： Silverbrook Research Pty Ltd
- 当前专利权人地址： AU Balmain, New South Wales
- 主分类号： B41J29/393
- IPC分类号： B41J29/393
摘要：
Provided is a method for testing integrity of a base for printhead integrated circuits. The base has at least one fluid inlet in fluid communication with a plurality of fluid outlets via discrete fluid paths. The method includes the steps of engaging the, or each, fluid inlet of the base to a fluid supply in a sealing manner, charging the base with pressurized fluid until a predetermined pressure is reached, and monitoring the pressure in the base for a predetermined period of time, wherein a rate of pressure decay is indicative of an integrity of the base.
公开/授权文献
信息查询
IPC分类:
