A semiconductor memory device includes a semiconductor memory, an auto-operation control circuit which outputs a clock signal, a sync read control circuit which outputs a sync read address in sync with the clock signal, a read control circuit which selects a read address of the semiconductor memory in accordance with an address of the sync read address, a read sense amplifier circuit which outputs a data read signal that is produced by sensing data that is read out of the semiconductor memory in accordance with the read address, and a determination circuit which compares the data read signal with an expectation value.